Application

11858442 · METHOD FOR ENHANCING THE MEASUREMENT CAPABILITY OF MULTI-PARAMETER INSPECTION SYSTEMS

Filed 2007-09-20 · Granted · Patent 7610170 (2009-10-27) The official file ↗The patent and its PDF ↗ · Art unit 2863 · Examiner Douglas N Washburn Easy · CPC G01N 21/47 · INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE · WPAT, PC

Office actions

first was Non-final rejection

RCEs

no appeal

To first action

10.5 mo

to disposition 25.2 mo

Statutes raised

102 103

1 actions read

Unlock the prosecution timelineIncluded in Pro, from $29 a month. Cancel any time.