Application

12391764 · SEMICONDUCTOR DEVICE HAVING VARIABLE PARAMETER SELECTION BASED ON TEMPERATURE AND TEST METHOD

Filed 2009-02-24 · Granted · Patent 7639548 (2009-12-29) The official file ↗The patent and its PDF ↗ · Art unit 2824 · Examiner Eric J Wendler Typical · CPC G01K 7/425 · SAMSUNG ELECTRONCS CO., LTD. · FOLEY & LARDNER LLP

Office actions

first was Notice of allowance

RCEs

no appeal

To first action

7.5 mo

to disposition 10.1 mo

Statutes raised

0 actions read

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