PATLY.AIApplication
12674644 · CHIP TESTER, METHOD FOR PROVIDING TIMING INFORMATION, TEST FIXTURE SET, APPARATUS FOR POST-PROCESSING PROPAGATION DELAY INFORMATION, METHOD FOR POST-PROCESSING DELAY INFORMATION, CHIP TEST SET UP AND METHOD FOR TESTING DEVICES UNDER TEST
Filed 2010-07-30 · Granted · Patent 8326565 (2012-12-04) The official file ↗The patent and its PDF ↗ · Art unit 2857 · Examiner Bryan Bui Easy · CPC G01R 31/3191 · ADVANTEST CORPORATION · Gregory W. Osterloth
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