Application
12877105 · SYSTEMS AND METHODS FOR MEASURING GEOMETRY PARAMETERS WITH A REFERENCE OBJECT WHOSE THICKNESS CAN NOT BE IGNORED IN IMAGES
Filed 2010-09-08 · Granted · Patent 8428392 (2013-04-23) The official file ↗The patent and its PDF ↗ · Art unit 2667 · Examiner Patrick L Edwards Typical · CPC G06T 7/60 · Feng Xiagen
Office actions
1
first was Non-final rejection
RCEs
0
no appeal
To first action
23.2 mo
to disposition 31.5 mo
Statutes raised
101
1 actions read