Application

13677542 · System for Wafer Quality Predictive Modeling based on Multi-Source Information with Heterogeneous Relatedness

Filed 2012-11-15 · Granted · Patent 9395408 (2016-07-19) The official file ↗The patent and its PDF ↗ · Art unit 2127 · Examiner Md Abul K Azad Typical · CPC G01R 31/2831 · GLOBALFOUNDRIES INC. · Thompson Hine LLP

Office actions

first was Non-final rejection

RCEs

no appeal

To first action

32.9 mo

to disposition 44.1 mo

Statutes raised

103 112 DP

2 actions read

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