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13803268 · SYSTEMS AND METHODS FOR TEST TIME OUTLIER DETECTION AND CORRECTION IN INTEGRATED CIRCUIT TESTING

Filed 2013-03-14 · Granted · Patent 8872538 (2014-10-28) The official file ↗The patent and its PDF ↗ · Art unit 2868 · Examiner Paresh H Patel Typical · CPC G01R 31/3172 · OPTIMALTEST, LTD. · KOWERT, HOOD, MUNYON, RANKIN & GOETZEL, P.C.

Office actions
2
first was Non-final rejection
RCEs
0
no appeal
To first action
2.7 mo
to disposition 19.5 mo
Statutes raised
101 DP
2 actions read
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