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14231885 · ATOMIC FORCE MICROSCOPY USING CORRELATED PROBE OSCILLATION AND PROBE-SAMPLE BIAS VOLTAGE

Filed 2014-04-01 · Abandoned The official file ↗ · Art unit 2881 · Examiner Phillip A Johnston Typical · CPC G01Q 60/32 · CHIPWORKS INCORPORATED · Daniels IP Services LTD.

Office actions
4
first was Non-final rejection
RCEs
1
no appeal
To first action
14.3 mo
to disposition 35.0 mo
Statutes raised
103
3 actions read
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