Application

14508715 · TWO DEGREE OF FREEDOM DITHERING PLATFORM FOR MEMS SENSOR CALIBRATION

Filed 2014-10-07 · Granted · Patent 9061891 (2015-06-23) The official file ↗The patent and its PDF ↗ · Art unit 2855 · Examiner John E Chapman Jr Typical · CPC B81C 1/00134 · Honeywell International Inc. · HONEYWELL/FOGG

Office actions

first was Notice of allowance

RCEs

no appeal

To first action

4.4 mo

to disposition 8.5 mo

Statutes raised

0 actions read

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