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14515986 · SEMICONDUCTOR STRUCTURE INCLUDING A DIE SEAL LEAKAGE DETECTION MATERIAL, METHOD FOR THE FORMATION THEREOF AND METHOD INCLUDING A TEST OF A SEMICONDUCTOR STRUCTURE

Filed 2014-10-16 · Granted · Patent 9455232 (2016-09-27) The official file ↗The patent and its PDF ↗ · Art unit 2828 · Examiner Joshua King Typical · CPC H10W 42/00 · GLOBALFOUNDRIES Inc. · GLOBALFOUNDRIES INC.

Office actions
1
first was Restriction requirement
RCEs
0
no appeal
To first action
11.4 mo
to disposition 23.4 mo
Statutes raised
102 103
1 actions read
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