Application

14566823 · SCAN TESTING WITH STAGGERED CLOCKS

Filed 2014-12-11 · Granted · Patent 9366724 (2016-06-14) The official file ↗The patent and its PDF ↗ · Art unit 2117 · Examiner Christine Trinh Le Tu Easy · CPC G01R 31/31725 · FREESCALE SEMICONDUCTOR, INC. · NXP USA, INC.

Office actions

first was Notice of allowance

RCEs

no appeal

To first action

14.2 mo

to disposition 18.1 mo

Statutes raised

0 actions read

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