Application
14710324 · WAFER PROBER INTEGRATED WITH FULL-WAFER CONTACTER
Filed 2015-05-12 · Granted · Patent 9612278 (2017-04-04) The official file ↗The patent and its PDF ↗ · Art unit 2867 · Examiner Raul J Rios Russo Typical · CPC G01R 1/07371 · TRANSLARITY, INC. · MR. DOMINIK SCHMIDT
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