Application

15179742 · INTEGRATED OPTICAL NANOSCALE PROBE MEASUREMENT OF ELECTRIC FIELDS FROM ELECTRIC CHARGES IN ELECTRONIC DEVICES

Filed 2016-06-10 · Granted · Patent 9778329 (2017-10-03) The official file ↗The patent and its PDF ↗ · Art unit 2884 · Examiner Marcus H Taningco Typical · CPC G01R 33/26 · Infinitum Solutions, Inc. · Paradice and Li, LLP

Office actions

first was Non-final rejection

RCEs

no appeal

To first action

8.8 mo

to disposition 15.8 mo

Statutes raised

1 actions read

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