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15215888 · Evaluation Condition Setting Method of Semiconductor Device, and Evaluation Condition Setting Apparatus

Filed 2016-07-21 · Granted · Patent 9947088 (2018-04-17) The official file ↗The patent and its PDF ↗ · Art unit 2851 · Examiner Thuan V Do Typical · CPC G06T 7/001 · Hitachi High-Technologies Corporation · CROWELL & MORING LLP

Office actions
1
first was Non-final rejection
RCEs
0
no appeal
To first action
12.6 mo
to disposition 20.9 mo
Statutes raised
102
1 actions read
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