Application

15390789 · HIGH VOLTAGE FAILURE RECOVERY FOR EMULATED ELECTRICALLY ERASABLE (EEE) MEMORY SYSTEM

Filed 2016-12-27 · Granted · Patent 10216564 (2019-02-26) The official file ↗The patent and its PDF ↗ · Art unit 2114 · Examiner Kamini B Patel Typical · CPC G06F 11/079 · NXP USA, Inc. · NXP USA, INC.

Office actions

first was Non-final rejection

RCEs

no appeal

To first action

15.8 mo

to disposition 26.0 mo

Statutes raised

101 DP

1 actions read

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