Application

15448445 · ABERRATION MEASUREMENT IN A CHARGED PARTICLE MICROSCOPE

Filed 2017-03-02 · Granted · Patent 10157727 (2018-12-18) The official file ↗The patent and its PDF ↗ · Art unit 2881 · Examiner Nicole Marie Ippolito Typical · CPC H01J 37/265 · FEI Company · Scheinberg & Associates, PC

Office actions

first was Notice of allowance

RCEs

no appeal

To first action

16.8 mo

to disposition 21.6 mo

Statutes raised

0 actions read

Unlock the prosecution timelineIncluded in Pro, from $29 a month. Cancel any time.