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15475879 · A STACKED SEMICONDUCTOR PACKAGE HAVING FAULT DETECTION AND A METHOD FOR IDENTIFYING A FAULT IN A STACKED PACKAGE

Filed 2017-03-31 · Granted · Patent 9972611 (2018-05-15) The official file ↗The patent and its PDF ↗ · Art unit 2825 · Examiner David Lam Easy · CPC H10W 90/00 · Intel Corporation · SCHWABE, WILLIAMSON & WYATT, P.C.

Office actions
0
first was Ex parte Quayle
RCEs
0
no appeal
To first action
5.4 mo
to disposition 13.5 mo
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0 actions read
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