Application

15534045 · A Measuring Device for Measuring Large Mass with Optical Refraction and Displacement Measuring

Filed 2017-06-08 · Granted · Patent 10274362 (2019-04-30) The official file ↗The patent and its PDF ↗ · Art unit 2856 · Examiner Monica S Young Hard · CPC G01G 23/01 · National Institute of Metrology · Meagher Emanuel Laks Goldberg & Liao, LLP

Office actions

first was Notice of allowance

RCEs

no appeal

To first action

20.4 mo

to disposition 22.7 mo

Statutes raised

0 actions read

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