Application

15626941 · APPARATUSES INCLUDING TEST SEGMENT CIRCUITS HAVING LATCH CIRCUITS FOR TESTING A SEMICONDUCTOR DIE

Filed 2017-06-19 · Granted · Patent 10330726 (2019-06-25) The official file ↗The patent and its PDF ↗ · Art unit 2867 · Examiner Vinh P Nguyen Typical · CPC G01R 31/2856 · MICRON TECHNOLOGY, INC. · Dorsey & Whitney LLP-IP Dept.-MTI

Office actions

first was Restriction requirement

RCEs

no appeal

To first action

16.9 mo

to disposition 24.2 mo

Statutes raised

102 112

1 actions read

Unlock the prosecution timelineIncluded in Pro, from $29 a month. Cancel any time.