PATLY.AIApplication
15851993 · METHODS FOR INSPECTING SEMICONDUCTOR WAFERS
Filed 2017-12-22 · Granted · Patent 10241051 (2019-03-26) The official file ↗The patent and its PDF ↗ · Art unit 2886 · Examiner Hoa Q Pham Typical · CPC G01N 21/6489 · BT IMAGING PTY LTD. · MATTINGLY & MALUR, PC
Office actions
1
first was Non-final rejection
RCEs
0
no appeal
To first action
4.7 mo
to disposition 15.1 mo
Statutes raised
102 103 DP
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