Application

15902106 · ACTIVE REAL-TIME CHARACTERIZATION SYSTEM FOR DETECTING PHYSICAL IMPERFECTIONS DURING SEMICONDUCTOR MANUFACTURING

Filed 2018-02-22 · Granted · Patent 10424057 (2019-09-24) The official file ↗The patent and its PDF ↗ · Art unit 2488 · Examiner Janese Duley Easy · CPC G06T 7/0004 · The Boeing Company · Boeing (TLG)

Office actions

first was Non-final rejection

RCEs

no appeal

To first action

11.4 mo

to disposition 19.0 mo

Statutes raised

1 actions read

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