Application

16170479 · CLOCK SELECTION CIRCUIT AND TEST CLOCK GENERATION CIRCUIT FOR LBIST AND ATPG TEST CIRCUIT

Filed 2018-10-25 · Granted · Patent 10393804 (2019-08-27) The official file ↗The patent and its PDF ↗ · Art unit 2112 · Examiner Christian M Dorman Hard · CPC G01R 31/31727 · STMicroelectronics International N.V. · CROWE & DUNLEVY - ST-US

Office actions

first was Non-final rejection

RCEs

no appeal

To first action

2.3 mo

to disposition 10.1 mo

Statutes raised

1 actions read

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