Application

16268550 · METHODS FOR INSPECTING SEMICONDUCTOR WAFERS

Filed 2019-02-06 · Granted · Patent 10502687 (2019-12-10) The official file ↗The patent and its PDF ↗ · Art unit 2886 · Examiner Hoa Q Pham Typical · CPC G01N 21/6489 · BT IMAGING PTY LTD · MATTINGLY & MALUR, PC

Office actions

first was Non-final rejection

RCEs

no appeal

To first action

3.6 mo

to disposition 10.1 mo

Statutes raised

1 actions read

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