Application

17118828 · METHOD AND APPARATUS COMPRISING A SEMICONDUCTOR DEVICE AND TEST APPARATUS

Filed 2020-12-11 · Granted · Patent 11415626 (2022-08-16) The official file ↗The patent and its PDF ↗ · Art unit 2866 · Examiner Courtney G McDonnough Typical · CPC H10W 74/114 · NXP B.V. · Intellectual Property and Licensing

Office actions

first was Non-final rejection

RCEs

no appeal

To first action

12.7 mo

to disposition 20.1 mo

Statutes raised

102 103 112

1 actions read

Unlock the prosecution timelineIncluded in Pro, from $29 a month. Cancel any time.