Application

17133895 · SCANNING PROBE MICROSCOPE AND OPTICAL AXIS ADJUSTMENT METHOD IN SCANNING PROBE MICROSCOPE

Filed 2020-12-24 · Granted · Patent 11162974 (2021-11-02) The official file ↗The patent and its PDF ↗ · Art unit 2881 · Examiner Nicole Marie Ippolito Typical · CPC G01Q 10/04 · Shimadzu Corporation · Muir Patent Law, PLLC

Office actions

first was Notice of allowance

RCEs

no appeal

To first action

6.6 mo

to disposition 10.3 mo

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