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Application

17353423 · SEMICONDUCTOR DEVICE AND SEMICONDUCTOR SYSTEM FOR TESTING ERROR CORRECTION CIRCUIT

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Filed 2021-06-21 · Granted · Patent 11475971 (2022-10-18) The official file ↗The patent and its PDF ↗ · Art unit 2827 · Examiner James G Norman Hard · CPC G11C 29/02 · SK hynix Inc. · William Park & Associates LTD.

Office actions
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first was Notice of allowance
RCEs
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no appeal
To first action
13.7 mo
to disposition 15.9 mo
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