Application

17353833 · METHOD AND TESTING APPARATUS RELATED TO WAFER TESTING

Filed 2021-06-22 · Granted · Patent 12013431 (2024-06-18) The official file ↗The patent and its PDF ↗ · Art unit 2863 · Examiner Edgar I Jimenez · CPC G01R 31/2858 · NANYA TECHNOLOGY CORPORATION · JCIPRNET

Office actions

first was Non-final rejection

RCEs

no appeal

To first action

28.6 mo

to disposition 35.9 mo

Statutes raised

101 103

1 actions read

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