Application

17355193 · ELECTRIC FIELD PROBE AND MAGNETIC FIELD PROBE CALIBRATION SYSTEM AND METHOD BASED ON MULTIPLE COMPONENTS

Filed 2021-06-23 · Granted · Patent 12055616 (2024-08-06) The official file ↗The patent and its PDF ↗ · Art unit 2863 · Examiner Edgar I Jimenez · CPC G01R 29/0878 · ZHEJIANG UNIVERSITY · Wiersch Law Group

Office actions

first was Non-final rejection

RCEs

no appeal

To first action

29.0 mo

to disposition 37.5 mo

Statutes raised

112

1 actions read

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