Application

17457166 · CIRCUITS AND TECHNIQUES FOR ASSESSING AGING EFFECTS IN SEMICONDUCTOR CIRCUITS

Filed 2021-12-01 · Granted · Patent 11733288 (2023-08-22) The official file ↗The patent and its PDF ↗ · Art unit 2858 · Examiner Raul J Rios Russo Typical · CPC G01R 31/2642 · Infineon Technologies AG · Shumaker & Sieffert, P.A.

Office actions

first was Non-final rejection

RCEs

no appeal

To first action

11.5 mo

to disposition 20.7 mo

Statutes raised

112

1 actions read

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