Application

17889993 · Non-Invaded Formation Density Measurement and Photoelectric Evaluation Using an X-Ray Source

Filed 2022-08-17 · Granted · Patent 12313809 (2025-05-27) The official file ↗The patent and its PDF ↗ · Art unit 2884 · Examiner Kiho Kim Easy · CPC G01V 5/12 · VISURAY TECHNOLOGY LTD. · Adams and Reese LLP

Office actions

first was Non-final rejection

RCEs

no appeal

To first action

9.2 mo

to disposition 33.3 mo

Statutes raised

103 112

1 actions read

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