Application

17901705 · Z-PROFILING OF WAFERS BASED ON X-RAY MEASUREMENTS

Filed 2022-09-01 · Granted · Patent 12480898 (2025-11-25) The official file ↗The patent and its PDF ↗ · Art unit 2857 · Examiner Michael J Dalbo Typical · CPC G01N 23/2252 · APPLIED MATERIALS ISRAEL LTD. · AMAT / Kilpatrick Townsend & Stockton LLP

Office actions

first was Restriction requirement

RCEs

no appeal

To first action

24.7 mo

to disposition 38.8 mo

Statutes raised

103 DP

2 actions read

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