Application

18055394 · ELECTROMAGNETIC NON-DESTRUCTIVE QUALITY TESTING METHOD, AND TESTING CIRCUIT AND SYSTEM THEREFOR

Filed 2022-11-14 · Granted · Patent 11656200 (2023-05-23) The official file ↗The patent and its PDF ↗ · Art unit 2858 · Examiner Sean M Curtis Typical · CPC G01N 27/83 · Jiangyin Tianrun Information Technology Co., Ltd · True Shepherd, LLC (W)

Office actions

first was Notice of allowance

RCEs

no appeal

To first action

4.2 mo

to disposition 6.2 mo

Statutes raised

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