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18072551 · AUTOMATIC DETERMINATION OF SPECTRUM AND SPECTROGRAM ATTRIBUTES IN A TEST AND MEASUREMENT INSTRUMENT

Filed 2022-11-30 · Granted · Patent 12656373 (2026-06-16) The official file ↗The patent and its PDF ↗ · Art unit 2857 · Examiner Xiuqin Sun Typical · CPC G01R 13/029 · Tektronix, Inc. · Tektronix/Miller Nash

Office actions
2
first was Non-final rejection
RCEs
0
no appeal
To first action
29.4 mo
to disposition 42.5 mo
Statutes raised
102 103 112
2 actions read
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