Application

18116279 · Integrated Research and Development System for High-throughput Preparation and Statistical Mapping Characterization of Materials

Filed 2023-03-01 · Granted · Patent 12547150 (2026-02-10) The official file ↗The patent and its PDF ↗ · Art unit 2115 · Examiner Michael Xuefei Tang Typical · CPC G16C 60/00 · NCS Testing Technology CO.,LTD · Zhigang Ma - HWLC

Office actions

first was Notice of allowance

RCEs

no appeal

To first action

33.2 mo

to disposition 35.4 mo

Statutes raised

0 actions read

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