Application

18199185 · SYSTEM AND METHOD FOR MEASURING SECOND ORDER AND HIGHER GRADIENTS

Filed 2023-05-18 · Granted · Patent 11933864 (2024-03-19) The official file ↗The patent and its PDF ↗ · Art unit 2858 · Examiner Christopher P McAndrew Typical · CPC G01R 33/022 · Trustees of Boston University · Barclay Damon LLP

Office actions

first was Notice of allowance

RCEs

no appeal

To first action

6.7 mo

to disposition 10.1 mo

Statutes raised

0 actions read

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