Application

18199858 · DEVICE FOR MEASURING PHYSICAL PROPERTY OF WAFER

Filed 2023-05-19 · Granted · Patent 12566094 (2026-03-03) The official file ↗The patent and its PDF ↗ · Art unit 2855 · Examiner Jamel E Williams Easy · CPC H10P 72/12 · FOXSEMICON INTEGRATED TECHNOLOGY, INC. · ScienBiziP, PC

Office actions

first was Non-final rejection

RCEs

no appeal

To first action

27.1 mo

to disposition 33.5 mo

Statutes raised

102 103

1 actions read

Unlock the prosecution timelineIncluded in Pro, from $29 a month. Cancel any time.