Application

18387815 · BROADBAND WAFER DEFECT DETECTION

Filed 2023-11-07 · Granted · Patent 12158434 (2024-12-03) The official file ↗The patent and its PDF ↗ · Art unit 2877 · Examiner Hoa Q Pham Typical · CPC G01N 21/9501 · Taiwan Semiconductor Manufacturing Co., Ltd. · DUANE MORRIS LLP (TSMC)

Office actions

first was Non-final rejection

RCEs

no appeal

To first action

6.9 mo

to disposition 12.9 mo

Statutes raised

1 actions read

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