Application
18401067 · MEMORY BUILT-IN SELF-TEST (MBIST) AND BIST ADAPTIVE PORT (BAP) FOR PERIODIC IN-FIELD TESTING
Filed 2023-12-29 · Pending The official file ↗ · Art unit OPAP · Examiner Docket Central Easy · CPC G11C 29/16 · Intel Corporation · Compass IP Law PC
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