PATLY.AIApplication
18434051 · WIENER PROCESS-BASED METHOD AND DEVICE FOR PROCESSING ACCELERATED DEGRADATION TESTING DATA
Filed 2024-02-06 · Granted · Patent 12079550 (2024-09-03) The official file ↗The patent and its PDF ↗ · Art unit 2148 · Examiner Chuen-Meei Gan Easy · CPC G06F 30/20 · China Electronic Product Reliability and Environmental Testing Research Institute · POLSINELLI PC
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