Application

18508177 · MACHINE AND DEEP LEARNING METHODS FOR SPECTRA-BASED METROLOGY AND PROCESS CONTROL

Filed 2023-11-13 · Granted · Patent 12321102 (2025-06-03) The official file ↗The patent and its PDF ↗ · Art unit 2116 · Examiner Yuhui R Pan Typical · CPC H10P 74/23 · NOVA LTD. · RECHES PATENTS

Office actions

first was Non-final rejection

RCEs

no appeal

To first action

8.9 mo

to disposition 18.7 mo

Statutes raised

103 112 DP

1 actions read

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