Application

18697737 · TERAHERTZ SPECTROSCOPY SYSTEM WITH SPECIALIZED MEASUREMENT UNIT FOR NON-DESTRUCTIVE SAMPLE DETECTION

Filed 2024-04-02 · Granted · Patent 12725085 (2026-09-01) The official file ↗The patent and its PDF ↗ · Art unit 2884 · Examiner William Laurence Taylor · CPC G01N 21/3586 · ANOR TECHNOLOGIES PTE. LTD. · IDEA Intellectual Limited

Office actions

first was Non-final rejection

RCEs

no appeal

To first action

20.0 mo

to disposition 29.0 mo

Statutes raised

103 112

1 actions read

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