Application

18895304 · METHOD AND APPARATUS FOR DIAMETER MEASUREMENT OF CZOCHRALSKI MONOCRYSTALLINE SILICON, AND DEVICE FOR GROWING CZOCHRALSKI MONOCRYSTALLINE SILICON

Filed 2024-09-24 · Pending The official file ↗ · Art unit 1714 · Examiner Hua Qi Hard · CPC C30B 15/26 · Zing Semiconductor Corporation · Chen Yoshimura LLP

Office actions

first was Restriction requirement

RCEs

no appeal

To first action

21.7 mo

to disposition n/a

Statutes raised

103 112

1 actions read

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