Application

19074604 · SINGLE WAFER-LEVEL CIRCUIT TESTING SYSTEM AND TESTING METHOD THEREOF

Filed 2025-03-10 · Pending The official file ↗ · Art unit 2852 · Examiner Jas A Sanghera Typical · CPC G01R 31/2891 · CHUNGHWA PRECISION TEST TECH. CO., LTD. · Dickinson Wright PLLC - Troy

Office actions

first was Ex parte Quayle

RCEs

no appeal

To first action

19.0 mo

to disposition n/a

Statutes raised

0 actions read

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