PATLY.AIApplication
19203228 · DEFECT DETECTION METHOD AND DEVICE BASED ON NONLINEAR SYSTEM IDENTIFICATION
Filed 2025-05-09 · Granted · Patent 12392699 (2025-08-19) The official file ↗The patent and its PDF ↗ · Art unit 2855 · Examiner Jonathan M Dunlap Typical · CPC G01N 3/34 · Wuhan Institute of Technology · LEONG C. LEI
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