PATLY.AIApplication
19214895 · MEASURING DEVICE DEFECT SENSITIZATION IN TRANSISTOR-LEVEL CIRCUITS
Filed 2025-05-21 · Pending The official file ↗ · Art unit OPAP · Examiner Docket Central Easy · CPC G01R 31/2848 · Synopsys, Inc. · Patterson + Sheridan, LLP - Synopsys
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