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19231932 · SEMICONDUCTOR STRUCTURE FOR DETECTING VERTICAL ELECTRICAL LEAKAGE

Filed 2025-06-09 · Pending The official file ↗ · Art unit 2893 · Examiner Benjamin Michael Kupp Typical · CPC H10P 74/277 · NANYA TECHNOLOGY CORPORATION · IntelliFluence Patent Firm

Office actions
1
first was Non-final rejection
RCEs
0
no appeal
To first action
15.4 mo
to disposition n/a
Statutes raised
103 112 DP
1 actions read
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