Application

19311798 · SYSTEM AND METHOD FOR GENERATING PREDICTIVE IMAGES FOR WAFER INSPECTION USING MACHINE LEARNING

Filed 2025-08-27 · Pending The official file ↗ · Art unit OPAP · Examiner Docket Central Easy · CPC G01N 23/2251 · ASML Netherlands B.V. · Finnegan/ASML

Office actions

first was

RCEs

no appeal

To first action

n/a

to disposition n/a

Statutes raised

0 actions read

Unlock the prosecution timelineIncluded in Pro, from $29 a month. Cancel any time.