Application

19372599 · PROBE SYSTEM, PROBE CARD, PROBE HEAD AND METHOD FOR TESTING ELECTRONIC DEVICE UNDER TEST INTEGRATED ON A SEMICONDUCTOR WAFER, AND ELECTRONIC DEVICE TESTED BY THE PROBE CARD

Filed 2025-10-29 · Pending The official file ↗ · Art unit OPAP · Examiner Docket Central Easy · CPC G01R 1/0675 · MPI CORPORATION · Troutman Pepper Locke LLP

Office actions

first was

RCEs

no appeal

To first action

n/a

to disposition n/a

Statutes raised

0 actions read

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