PATLY.AIApplication
19380830 · GATE-INDUCED DRAIN LEAKAGE PRE-CHARGE IN SUB-BLOCK MODE FOR THREE OR MORE TIER NON-VOLATILE MEMORY STRUCTURE
Filed 2025-11-05 · Pending The official file ↗ · Art unit OPAP · Examiner Docket Central Easy · CPC G11C 16/0483 · Sandisk Technologies, Inc. · Dickinson Wright PLLC/Sandisk
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