Application

19576305 · PATTERN INSPECTION APPARATUS, FOCUS POSITION ADJUSTMENT METHOD, AND PATTERN INSPECTION METHOD

Filed 2026-03-24 · Pending The official file ↗ · Art unit OPAP · Examiner Docket Central Easy · CPC G01N 21/956 · NuFlare Technology, Inc. · OBLON, MCCLELLAND, MAIER & NEUSTADT, L.L.P.

Office actions

first was

RCEs

no appeal

To first action

n/a

to disposition n/a

Statutes raised

0 actions read

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