Application

19715915 · METHOD FOR PREDICTING DEFECT IN SEMICONDUCTOR DEVICE

Filed 2026-06-22 · Pending The official file ↗ · Art unit OPAP · Examiner Docket Central Easy · CPC G06N 20/00 · Samsung Electronics Co., Ltd. · Samsung Electronics Co., Ltd.

Office actions

first was

RCEs

no appeal

To first action

n/a

to disposition n/a

Statutes raised

0 actions read

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